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Home Semiconductor News

Anritsu Launches TestDeck™ Web Solution to enhance Test & Measurement

Semiconductor For You by Semiconductor For You
January 27, 2026
in Semiconductor News
0

21/01/2026
Integrated Test Systems & Data Management Accelerates Global Testing, Installation & Management

21 January 2026–ANRITSU CORPORATION has launched TestDeck™, a web-based solution designed to promote digital transformation (DX) of mobile device testing. TestDeck integrates test planning, configuration, execution, and results management by connecting multiple communication test and measurement systems to a web server and aggregating test data. This centralized approach streamlines test operations and supports new perspectives in test analysis.

TestDeck web-based solution enhances the efficiency of test operations for communication test and measurement systems. TestDeck users can centrally manage test results and progress to rapidly identify performance trends and issues by device version using collected historical data. Furthermore, by visualizing and sharing centralized communication test and measurement systems, TestDeck optimizes testing across multiple domestic and international sites, helping cut test costs and shortening mobile device development cycles.

Anritsu is continuing to expand TestDeck functions to further advance test operations in the Beyond 5G and 6G eras.

Development Background
The number of required mobile device test items continues growing as communication standards and device functions evolve, increasing the test burden for vendors. Additionally, fragmented test data from different global test environments makes cross-functional analysis and results sharing difficult. TestDeck addresses these challenges by aggregating and visualizing equipment and test data for efficient testing.

Product Overview
TestDeck web solution promotes the digital transformation of testing. It supports efficient use of communication test and measurement systems, streamlines workflows, and optimizes testing on a global scale for both efficiency and new analytical perspectives.

Key Features:
• Test Vision: Centralized management of test results for failure cause and device trend analyses
• Test Hub: Aggregated management of test environments, plans, reservations, execution, and results
• Test Utilization: Centralized management of test equipment and licenses
• Comprehensive Test Automation (for PCT*1/RFCT*2): Automated GCF/PTCRB-based test planning for efficient measurement system operation

Supported Products:
• 5G NR Mobile Device Test Platform ME7834NR
• New Radio RF Conformance Test System ME7873NR
• Rapid Test Designer Platform (RTD) MX800050A
• SmartStudio NR MX800070A
Contact Anritsu to learn more about TestDeck MX710000A

Technical Terms

*1 PCT
Abbreviation for Protocol Conformance Test—key ME7834NR function for evaluating whether device adheres to various 3GPP communication protocol procedures following GCF/PTCRB certification requirements

*2 RFCT
Abbreviation for RF Conformance Test—key ME7873NR function for evaluating whether device TRx characteristics meet 3GPP radio parameter specifications following GCF/PTCRB certification requirements

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Tags: Anritsutest and measurement
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Anritsu Launches TestDeck™ Web Solution to enhance Test & Measurement

January 27, 2026
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