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Home Semiconductor News

LTX-Credence Ships 600th PAx Test System

Semiconductor For You by Semiconductor For You
August 29, 2017
in Semiconductor News
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Precise band gap measurement is 30 percent higher than expected
Precise band gap measurement is 30 percent higher than expected

LTX-Credence, a US provider of equipment and services to the semiconductor, industrial, and electronics manufacturing industries, has shipped its 600th PAx test system to Skyworks Solutions, a maker of analogue semiconductors.

The PAx platform has been designed to address the high volume manufacturing test challenges of suppliers of advanced front end RF devices such as multiband RF power amplifiers, RF front end modules, RF analogues system in package and RF discrete devices. The PAx platform is shipped in two main configurations, PAx and PAx-ac, which are deployed at most IDM, Fabless and OSAT companies specialising in the high volume manufacturing and test of these types of devices.

“Our goal with the PAx platform was to offer semiconductor manufacturers of RF front end devices an alternative to deploying their own in house test systems.,” Steve Wigley, Vice president of the semiconductor tester group of Xcerra (the parent compact of LTX-Credence).

“Our approach was to leverage LTX-Credence RF manufacturing test technology and use our systems expertise to package it in a compact footprint to offer the required levels of performance, fast test times and operational availability. The shipment of the 600th of these test systems demonstrates the value of this approach, and has established the PAx platform as the clear market leader for testing RF front end applications with an estimated market share greater than 70 percent”.

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