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Home Semiconductor News

CST Global To Increase Laser Test Throughput

Semiconductor For You by Semiconductor For You
May 5, 2017
in Semiconductor News
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Automatic visual inspection trebles laser throughput and increases test accuracy

Automatic visual inspection trebles laser throughput and increases test accuracy

CST Global, the UK-based III-V opto-electronics foundry, has introduced an automatic visual inspection machine, increasing laser throughput and test accuracy.

According to Colin Jackson, production project engineer at CST Global, the new inspection machine takes throughput from 10,000 lasers per shift to 30,000.

CST Global worked with the visual inspection machine manufacturer, Keyence, and software developer, Wolf, to commission, develop and optimise the new  machine.

“The Visual Inspection machine brings other key benefits to CST Global. We now only need one inspector per shift, allowing us to re-deploy valuable resources elsewhere. We can track wafer batch quality, working with our key suppliers to help increase yield. Finally, we are streamlining the visual inspection process to handle yet more gel packs per shift. We expect throughputs to near 40,000 lasers per shift, shortly,” adds Jackson.

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